Microscopy

Delta Analytical Instruments, Inc.
1061 Main Street
North Huntingdon, PA 15642
USA

Tel : (724) 864-9850
Fax : (724) 864-9851

INSTRUMENTATION:

Visualization of material can yield many answers to questions regarding material behavior and process problems. Combined with the instrument's ability to perform particle size analysis, SEM becomes a supplement to other characterization methods. Although more expensive than other methods, the ability to "see" material and determine aspect ratios or other shape factors may prove to be of great advantage to a client.

RESULTS:

Photomicrographs are provided at magnifications directed by the client. Preparation and loading of the samples are also at the direction of the client (if known).  Resulting images may be
e-mailed or copied to a CD.

TRANSMISSION ELECTRON MICROSCOPY (TEM):

Several preparation techniques can be employed when preparing samples for TEM analysis. The resulting sample is very thin, with thickness in the nanometer range, to allow electrons to transmit through the sample. The wavelengths of the electron beams used in TEM to irradiate samples are smaller than the light beams used in light microscopy; therefore, the resolution of TEM is much greater than that of light microscopy.

IMPORTANCE:

TEM is used to view cell structures, to determine grain sizes, to determine crystallography of materials, and to analyze processes and failures.